Craig Herzinger: search on Z-Library

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1

SPIE Proceedings [SPIE Polarimetry and Ellipsometry - Kazimierz Dolny, Poland (Monday 20 May 1996)] Polarimetry and Ellipsometry - Application of generalized ellipsometry to complex optical systems

Schubert, Mathias, Rheinlaender, Bernd, Woollam, John A., Johs, Blaine D., Herzinger, Craig M., Pluta, Maksymilian, Wolinski, Tomasz R.

Year:

1997

Language:

english

File:

PDF, 576 KB

english, 1997

2

SPIE Proceedings [SPIE Critical Review Collection - Bellingham, United States (Friday 13 January 2017)] Optical Metrology - Overview of variable-angle spectroscopic ellipsometry (VASE): I. Basic theory and typical applications

Woollam, John A., Johs, Blaine D., Herzinger, Craig M., Hilfiker, James N., Synowicki, Ron A., Bungay, Corey L.

Year:

2017

Language:

english

File:

PDF, 656 KB

english, 2017

3

Optical constants of electroplated gold from spectroscopic ellipsometry

Synowicki, R.A., Herzinger, Craig M., Hall, James T., Malingowski, Andrew

Journal:

Applied Surface Science

Year:

2017

Language:

english

File:

PDF, 1.96 MB

english, 2017

4

Progress in spectroscopic ellipsometry: Applications from vacuum ultraviolet to infrared

N. Hilfiker, James, Bungay, Corey L, Synowicki, Ron A., Tiwald, Thomas E., Herzinger, Craig M., Johs, Blaine, Pribil, Greg K., Woollam, John A.

Journal:

Journal of Vacuum Science & Technology A Vacuum Surfaces and Films

Year:

2003

Language:

english

File:

PDF, 412 KB

english, 2003

5

Generalized far-infrared magneto-optic ellipsometry for semiconductor layer structures: determination of free-carrier effective-mass, mobility, and concentration parameters in n-type GaAs

Schubert, Mathias, Hofmann, Tino, Herzinger, Craig M.

Journal:

Journal of the Optical Society of America A

Year:

2003

Language:

english

File:

PDF, 252 KB

english, 2003

6

SPIE Proceedings [SPIE Critical Review Collection - Bellingham, United States (Friday 13 January 2017)] Optical Metrology: A Critical Review - Overview of variable-angle spectroscopic ellipsometry (VASE): II. Advanced applications

Johs, Blaine, Woollam, John A., Herzinger, Craig M., Hilfiker, James N., Synowicki, Ron A., Bungay, Corey L.

Year:

2017

Language:

english

File:

PDF, 675 KB

english, 2017

7

Far-infrared magnetooptic generalized ellipsometry: determination of free-charge-carrier parameters in semiconductor thin film structures

Mathias Schubert, Tino Hofmann, Craig M. Herzinger

Journal:

Thin Solid Films

Year:

2004

Language:

english

File:

PDF, 234 KB

english, 2004

8

Generalized transmission ellipsometry for twisted biaxial dielectric media: application to chiral liquid crystals

Schubert, Mathias, Rheinlander, Bernd, Cramer, Christiane, Schmiedel, Herbert, Woollam, John A., Herzinger, Craig M., Johs, Blaine

Journal:

Journal of the Optical Society of America A

Year:

1996

Language:

english

File:

PDF, 2.48 MB

english, 1996

9

Far-infrared magnetooptical generalized ellipsometry determination of free-carrier parameters in semiconductor thin film structures

Hofmann, Tino, Grundmann, Marius, Herzinger, Craig M., Schubert, Mathias, Grill, Wolfgang

Journal:

MRS Proceedings

Year:

2002

Language:

english

File:

PDF, 151 KB

english, 2002

10

Incoherent like- and cross-polarized backscatter cross sections of an anisotropic rough sea surface with swell

Bahar, Ezekiel, Herzinger, Craig M., Fitzwater, Mary Ann

Journal:

Journal of Geophysical Research

Year:

1989

Language:

english

File:

PDF, 865 KB

english, 1989

11

Estimating Depolarization with the Jones Matrix Quality Factor

Hilfiker, James N., Hale, Jeffrey S., Herzinger, Craig M., Tiwald, Tom, Hong, Nina, Schöche, Stefan, Arwin, Hans

Journal:

Applied Surface Science

Year:

2016

Language:

english

File:

PDF, 2.61 MB

english, 2016

12

Terahertz Ellipsometry Using Electron-Beam Based Sources

Hofmann, Tino, Herzinger, Craig M., Schade, Ulrich, Mross, Michael, Woollam, John A., Schubert, Mathias

Journal:

MRS Proceedings

Year:

2008

Language:

english

File:

PDF, 107 KB

english, 2008

13

Extension of rotating-analyzer ellipsometry to generalized ellipsometry: determination of the dielectric function tensor from uniaxial TiO_2

Schubert, Mathias, Rheinländer, Bernd, Woollam, John A., Johs, Blaine, Herzinger, Craig M.

Journal:

Journal of the Optical Society of America A

Year:

1996

Language:

english

File:

PDF, 5.51 MB

english, 1996

14

SPIE Proceedings [SPIE International Symposium on Optical Science and Technology - San Diego, CA (Sunday 29 July 2001)] Optical Metrology Roadmap for the Semiconductor, Optical, and Data Storage Industries II - Recent developments in spectroscopic ellipsometry for in-situ applications

Johs, Blaine D., Hale, Jeff, Ianno, Natale J., Herzinger, Craig M., Tiwald, Thomas E., Woollam, John A., Duparre, Angela, Singh, Bhanwar

Year:

2001

Language:

english

File:

PDF, 456 KB

english, 2001

15

In Situ Multi-Wavelength Ellipsometric Control of Thickness and Composition For Bragg Reflector Structures

Herzinger, Craig, Johs, Blaine, Chow, Peter, Reich, Dave, Carpenter, Greg, Croswell, Dan, Hove, Jim Van

Journal:

MRS Proceedings

Year:

1995

Language:

english

File:

PDF, 952 KB

english, 1995

16

Spectroscopic Ellipsometry and Band Structure of Si1–yCy Alloys Grown Pseudomorphically on Si (001)

Zollner, Stefan, Herzinger, Craig M., Woollam, John A., Lyer, Subramanian S., Powell, Adrian P., Eberl, Karl

Journal:

MRS Proceedings

Year:

1995

Language:

english

File:

PDF, 373 KB

english, 1995

17

[IEEE 2009 34th IEEE Photovoltaic Specialists Conference (PVSC) - Philadelphia, PA, USA (2009.06.7-2009.06.12)] 2009 34th IEEE Photovoltaic Specialists Conference (PVSC) - Characterizing antireflection coatings on textured monocrystalline silicon with Spectroscopic Ellipsometry

Sun, Jianing, Saenger, Mario F., Schubert, Mathias, Hilfiker, James N., Ron Synowicki,, Herzinger, Craig M., Woollam, J. A.

Year:

2009

Language:

english

File:

PDF, 1.46 MB

english, 2009

18

Refractive indices and band-gap properties of rocksalt Mg[sub x]Zn[sub 1−x]O (0.68≤x≤1)

Schmidt-Grund, Rüdiger, Carstens, Anke, Rheinländer, Bernd, Spemann, Daniel, Hochmut, Holger, Zimmermann, Gregor, Lorenz, Michael, Grundmann, Marius, Herzinger, Craig M., Schubert, Mathias

Journal:

Journal of Applied Physics

Year:

2006

Language:

english

File:

PDF, 434 KB

english, 2006

19

SPIE Proceedings [SPIE Polarimetry and Ellipsometry - Kazimierz Dolny, Poland (Monday 20 May 1996)] Polarimetry and Ellipsometry - Real-time monitoring and control during MBE growth of GaAs/AlGaAs Bragg reflectors using multiwave ellipsometry

Wagner, Thomas, Johs, Blaine D., Herzinger, Craig M., He, Ping, Pittal, Shakil, Woollam, John A., Pluta, Maksymilian, Wolinski, Tomasz R.

Year:

1997

Language:

english

File:

PDF, 628 KB

english, 1997

20

Precision in ellipsometrically determined sample parameters: simulation and experiment

Blaine Johs, Craig M. Herzinger

Journal:

Thin Solid Films

Year:

2004

Language:

english

File:

PDF, 154 KB

english, 2004

21

Optical constants of GaxIn1−xP lattice matched to GaAs

Schubert, Mathias, Gottschalch, V., Herzinger, Craig M., Yao, Huade, Snyder, Paul G., Woollam, John A.

Journal:

Journal of Applied Physics

Year:

1995

Language:

english

File:

PDF, 704 KB

english, 1995

22

SPIE Proceedings [SPIE International Symposium on Optical Science and Technology - San Diego, CA (Sunday 30 July 2000)] Optical Metrology Roadmap for the Semiconductor, Optical, and Data Storage Industries - Variable angle spectroscopic ellipsometry in the vacuum ultraviolet

Woollam, John A., Hilfiker, James N., Tiwald, Thomas E., Bungay, Corey L., Synowicki, Ron A., Meyer, Duane E., Herzinger, Craig M., Pfeiffer, Galen L., Cooney, Gerald T., Green, Steven E., Al-Jumaily,

Year:

2000

Language:

english

File:

PDF, 1.21 MB

english, 2000

23

Advanced Terahertz Frequency-Domain Ellipsometry Instrumentation for In Situ and Ex Situ Applications

Kuhne, Philipp, Armakavicius, Nerijus, Stanishev, Vallery, Herzinger, Craig M., Schubert, Mathias, Darakchieva, Vanya

Journal:

IEEE Transactions on Terahertz Science and Technology

Year:

2018

Language:

english

File:

PDF, 4.04 MB

english, 2018

24

Computation, visualization, and animation of infrared Mueller matrix elements by scattering from surfaces that are absorbing and randomly rough

Carrieri, Arthur H., Jeffrey Schmitt, Charles, Herzinger, Craig M., Jensen, James O.

Journal:

Year:

1993

Language:

english

File:

PDF, 723 KB

english, 1993

25

Materials Characterization using THz Ellipsometry

Hofmann, Tino, Herzinger, Craig M., Woollam, John A., Schubert, Mathias

Journal:

MRS Proceedings

Year:

2009

Language:

english

File:

PDF, 104 KB

english, 2009

26

SPIE Proceedings [SPIE International Symposium on Optical Science and Technology - Seattle, WA (Sunday 7 July 2002)] Advanced Characterization Techniques for Optical, Semiconductor, and Data Storage Components - Far-infrared magneto-optic generalized ellipsometry determination of free-carrier parameters in semiconductor thin film structures

Hofmann, Tino, Schubert, Mathias, Herzinger, Craig M., Duparr, Angela, Singh, Bhanwar

Year:

2002

Language:

english

File:

PDF, 115 KB

english, 2002

27

Piezo-optical response of Si1−yCy alloys grown pseudomorphically on Si (001)

Stefan Zollner, Craig M. Herzinger, John A. Woollam, Subramanian S. Iyer, Adrian P. Powell, Karl Eberl

Journal:

Solid State Communications

Year:

1995

Language:

english

File:

PDF, 409 KB

english, 1995

28

Real-time monitoring and control during MBE growth of GaAs/AlGaAs Bragg reflectors using multi-wavelength ellipsometry

Blaine Johs, Craig Herzinger, Ping He, Shakil Pittal, John Woollam, Thomas Wagner

Journal:

Materials Science and Engineering: B

Year:

1997

Language:

english

File:

PDF, 475 KB

english, 1997

29

SPIE Proceedings [SPIE Microlithography 2004 - Santa Clara, CA (Sunday 22 February 2004)] Optical Microlithography XVII - Immersion fluid refractive indices using prism minimum deviation techniques

French, Roger H., Yang, Min K., Lemon, Michael F., Synowicki, Ron A., Pribil, Greg K., Cooney, Gerald T., Herzinger, Craig M., Green, Steven E., Burnett, John H., Kaplan, Simon G., Smith, Bruce W.

Year:

2004

Language:

english

File:

PDF, 336 KB

english, 2004

30

Characterization of an Asymmetric Triangular Multiple Quantum Well, by Variable Angle Spectroscopic Ellipsometry

Herzinger, Craig M., Snyder, Paul G., Woollam, John A., Evans, Keith, Stutz, C.E., Jones, R., Merkel, K.G., Reynolds, D.C.

Journal:

MRS Proceedings

Year:

1989

Language:

english

File:

PDF, 360 KB

english, 1989

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